agilent N7788B/bd optical component analyzer data sheet introduction agilent technologies pushes the limits of component measurements with the N7788B component analyzer. its proprietary technology is comparable with the well- known jones-matrix-eigenanalysis (jme) which is the standard method for measuring polarization mode dispersion (pmd) or differential group delay (dgd) of optical devices. compared to the jme, agilents new single scan technology offers a range of advantages: a complete set of parameters: figure 2. N7788B bench-top mainframe figure 1. N7788Bd bench-top mainframe with built-in pc dgd/pmd pdl power/loss te/tm-loss jones matrices mueller matrices 2nd-order pmd (depolarization + pcd) principal states of polarization (psps) key bene? ts highest accuracy in a single sweep: no averaging over multiple sweeps required high measurement speed: complete measurement across c/l-band in less than 10 seconds (no need to wait for many averages) robustness against ? ber movement/ vibration and drift: fixing ? bers with sticky tape on the table or even operation on isolated optical table is not required! no limitation on optical path length of component the internal referencing scheme guarantees reliable and accurate measurements.
2 laser in smf pmf usb polarimeter gpib linbo 3 polarization controller trigger in trigger out power in dut microcontroller board the instrument setup is shown in the figure 3. a linbo3 polarization controller determines the input polarization to the dut. while the tunable laser source is sweeping over the desired wavelength range, a polarimeter analyzes the output state of polarization while input polarization is being modi? ed. the result will be a highly accurate device charac- terization with respect to dgd/pdl/loss, etc. furthermore, the internal optical switch provides continuous self calibra- tion for excellent repeatability. resolving te/tm insertion loss the te/tm-function allows accurate determination of the minimum and maximum loss of the dut at each wavelength. due to birefringence, optical ? lters tend to show different transmission functions depending on the polarization state. as shown in figure 4, these functions are typically shifted in wavelength depending on the amount of birefringence. the capability of performing quick pmd-measurements makes this measurement system well-suited for collecting long-term pmd data. the pc software allows to continuously collect the spectral pmd data and store it on the hard disc. the data can then be visualized as pseudo-color plot (see figure 5). figure 3. instrument setup applications fiber characterization: smf, pmf, dcf passive component testing: ? lters, isolators, circulators dynamic component / module testing: oadm / roadm active component testing: edfas, soas, voas link test: in-channel measurements across ampli? ers designed for the manufacturing ? oor high throughput a complete analysis across the c and the l band is per- formed in less than 10 seconds! software drivers a range of software drivers is available for external control of the system. this allows easy integration in common erp systems. remote control control of the instrument through lan or via the internet is supported. this supports automation as well as trouble shooting. report generation generating pdf reports is supported. the content including layout is con? gurable by the user. real time power readout high throughput measurement of non-connectorized components is supported by providing a real time power readout which enables ? ber coupling of the new device barcode scanner barcode scanning is supported for quick transfer of the dut serial number agilent N7788B instrument setup and application examples wavelength [nm] 1559 0 -10 -20 -30 -40 -50 te/tm loss [db] 1560 1561 figure 4. polarization-dependent wavelength shift (pd-) of a ? lter.
3 dgd wavelength pdf dgd wavelength time dgd particularly for characterizing optical ? lters, the high dynamic range of the N7788B allows accurate resolution of the ? lters side lobes. the internal reference path allows measurement of insertion loss spectra with excellent accuracy, minimizing the in? u- ence of the power characteristics of the tunable laser source. due to the excellent spectral resolution, the agilent N7788B is best suited for intra-channel dgd/pdl characterization. the all-parameter-jme algorithm allows ? exible adjustments of the wavelength resolution without the need to repeat the measurement. this allows the user to easily ? nd the optimum trade-off between pdl/dgd accuracy and wavelength resolution. wavelength [nm] insertion loss [db ] 0 -20 -40 -60 1545 1546 1547 1548 1549 wavelength [nm] 1521.2 1521.3 1521.4 1521.5 0 -30 -20 -10 insertion loss [db] figure 5. long term dgd measurements. figure 6. side lobes of an optical ? lter. figure 7. loss curve of a dpsk demodulator.
4 table 1: speci? cations 1) N7788B/bd optical component analyzer wavelength speci? cation wavelength range 1270 nm ... 1375 nm (opt 300, o-band) 1270 nm ... 1375 nm, 1460 nm ... 1620 nm (opt 400, o/c/l-band) 1460 nm ... 1620 nm (opt 500, c/l-band) operating wavelength range 2) 1260 nm ... 1640 nm differential delay dgd uncertainty resolution 2,0 nm: (30 fs + 0.3% dgd) resolution 0,1 nm: (30 fs + 3.0% dgd) dgd measurement range 3) 0 ... 1000 ps pmd uncertainty 4) (30 fs + 2.0% dgd) pmd repeatability (typical) 3 fs pmd measurement range 4) 0 ... 300 ps loss pdl uncertainty (typical) 5) c/l-band: (0.05 db + 4% pdl) o-band: (0.05 db + 4% pdl) pdl repeatability (typical) 5 mdb insertion loss uncertainty (typical) 3) c/l-band: 0.03 db o-band: 0.07 db insertion loss dynamic range (typical) 3) > 41 db (for higher tls power levels, increase value accordingly) polarization analysis see n7781b 1) ambient temperature change max 0.5c since normalization. valid for 81600b tunable laser source family. tls power set to - 6 dbm. sweep over speci? cation wavelength range. speci? cation does not include instability in test device. speci? ed loss ranges include loss of test device and any additional switches or connections in the optical path. speci? cation valid on day of calibration. 2) sop/dop measurements are only possible outside the speci? cation wavelength range if the user performs a manual calibration. 3) dut properties: insertion loss < 30 db, pdl < 1 db, dgd < 150 ps. speci? cation is typical for dgd > 150 ps. 4) dut properties: insertion loss < 41 db, pdl < 3 db, pmd < 50 ps. applies for highly mode-coupled devices such as single mode ? bers. speci? cation applies for pmd being averaged dgd over a wavelength span of 100 nm. speci? cation is typical for pmd < 50 ps. 5) dut properties: insertion loss < 25 db, pdl < 6 db. note: dut connectors are considered as being part of the dut. thus, angl ed con- nectors will add to the device pdl.
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